A system for measuring RFID strap characteristics by coupling through a dielectric. The system can include a meter, test pads, springs, and wiring. Test pads may contact a substrate opposite of the RFID strap, and the coupling capacitance through the dielectric substrate may be utilized to calculate the strap capacitance. Similarly, other electrical properties of an RFID strap or other RFID assembly may be measured by coupling through a dielectric.
