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CALIBRATION OF A NEAR INFRARED MEASUREMENT UNIT USING SIMULATED NEAR INFRARED SPECTRA OBTAINED FROM MEASURED MID INFRARED SPECTRA
专利权人:
TREE OF KNOWLEDGE PATENTS B.V.
发明人:
VEDDER, Hermanus Wouter,TERHOEVEN-URSELMANS, Thomas
申请号:
WO2016NL50366
公开号:
WO2016186507(A1)
申请日:
2016.05.23
申请国别(地区):
世界知识产权组织国际局
年份:
2016
代理人:
摘要:
The invention relates to a method for calibrating an near infrared measurement unit for characterizing a physical, chemical and/or biological parameter of a mineral and/or organic sample. The method comprising a step of providing a multiple number of near infrared calibration data of a mineral and/or organic sample class said near infrared calibration data including a simulated near infrared spectrum measurement. Further, the method comprises a step of feeding a calibration model of near infrared measurements with the multiple number of near infrared calibration data. Here, at least a subset of the near infrared calibration data is based on mid infrared measurements.
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中国工程科技知识中心
来源网址:
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