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Ophthalmic equipment
专利权人:
NIDEK CO LTD;株式会社ニデック
发明人:
滝井 通浩,羽根渕 昌明,立花 献,TAKII MICHIHIRO,HANEBUCHI MASAAKI,TACHIBANA KEN
申请号:
JP2018226279
公开号:
JP2020089410A
申请日:
2018.12.03
申请国别(地区):
JP
年份:
2020
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an ophthalmologic apparatus capable of accurately measuring an optical characteristic of an eye to be examined. An optical member that guides a measurement light beam to an eye to be inspected, and is used as an optical path for the left eye and an optical path for the right eye through which the measurement light beam passes, and the optical axis of the optical member is the light path of the optical path for the left eye. Axis and an optical member arranged so as to be eccentric with respect to the optical axis of the optical path for the right eye, a projection optical system for projecting a measurement light beam to the fundus of the eye to be examined through the optical member, and the measurement light beam being the fundus. The reflected light flux reflected by, a light receiving optical system for receiving via an optical member, and an ophthalmologic apparatus for objectively measuring the optical characteristics of the eye to be inspected, the pupil conjugate position of the eye to be inspected Is provided at a different position, and has a correction member that corrects the distortion of the measurement region on the pupil caused by the measurement light beam passing through the optical member. [Selection diagram]【課題】 被検眼の光学特性を精度よく測定できる眼科装置を提供する。【解決手段】 被検眼に測定光束を導光する光学部材であって、測定光束が通過する左眼用光路と右眼用光路で兼用され、光学部材の光軸が、左眼用光路の光軸及び右眼用光路の光軸に対して偏心するように配置される光学部材と、測定光束を、光学部材を介して被検眼の眼底に投光する投光光学系と、測定光束が眼底にて反射された反射光束を、光学部材を介して受光する受光光学系と、を有し、被検眼の光学特性を他覚的に測定する眼科装置であって、被検眼の瞳共役位置とは異なる位置に配置され、測定光束が光学部材を介することにより生じる瞳上の測定領域の歪みを補正する補正部材を備える。【選択図】 図1
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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