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Integrated surgical microscope and wavefront sensor
专利权人:
Anthony Y. Van Heugten;Daniel S. Durrie
发明人:
Anthony Y. Van Heugten,Daniel S. Durrie
申请号:
US13021594
公开号:
US08394083B2
申请日:
2011.02.04
申请国别(地区):
US
年份:
2013
代理人:
摘要:
A wavefront sensor is integrated with a surgical microscope for allowing a doctor to make repeated wavefront measurements of a patient's eye while the patient remains on an operating table in the surgical position. The device includes a wavefront sensor optically aligned with a surgical microscope such that their fields of view at least partially overlap. The inclusion of lightweight, compact diffractive optical components in the wavefront sensor allows the integrated device to be supported on a balancing mechanism above a patient's head during a surgical procedure. As a result, the need to reposition the device and/or the patient between measuring optical properties of the eye and performing surgical procedures on the eye is eliminated. Many surgical procedures may be improved or enhanced using the integrated device, including but not limited to cataract surgery, Conductive Keratoplasty, Lasik surgery, and corneal corrective surgery.
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中国工程科技知识中心
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