A sensor platform is provided for interrogating a sample with an electromagnetic (EM) wave. The platform includes: a dielectric material having opposing first and second planar surfaces; a first array of loop elements embedded in the first planar surface of the dielectric material, wherein slots are formed between the loop elements in the first array of loop elements and configured to host a sample material therein; and a second array of loop elements embedded in the second planar surface of the dielectric material and formed symmetrically with respect to the first array of loop elements, wherein slots are also formed between the loop elements of the second array of loop elements. The loop elements in the first array and the second array are comprised of a conductive material.
