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Structured-light imaging systems and methods for determining sub-diffuse scattering parameters
专利权人:
The Trustees of Dartmouth College
发明人:
Stephen Chad Kanick,Brian William Pogue,Keith D. Paulsen,Jonathan T. Elliott,David M. McClatchy, III,Venkataramanan Krishnaswamy
申请号:
US15013623
公开号:
US10463256B2
申请日:
2016.02.02
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A method for determining sub-diffuse scattering parameters of a material includes illuminating the material with structured light and imaging remission by the material of the structured light. The method further includes determining, from captured remission images, sub-diffuse scattering parameters of the material. A structured-light imaging system for determining sub-diffuse scattering parameters of a material includes a structured-light illuminator, for illuminating the material with structured light of periodic spatial structure, and a camera for capturing images of the remission of the structured light by the material. The structured-light imaging system further includes an analysis module for processing the images to quantitatively determine the sub-diffuse scattering parameters. A software product includes machine-readable instructions for analyzing images of remission of structured light by a material to determine sub-diffuse scattering parameters of the material.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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