Stephen Chad Kanick,Brian William Pogue,Keith D. Paulsen,Jonathan T. Elliott,David M. McClatchy, III,Venkataramanan Krishnaswamy
申请号：
US16673165
公开号：
US20200069187A1
申请日:
2019.11.04
申请国别(地区):
US
年份:
2020
代理人:
摘要：
A method for determining sub-diffuse scattering parameters of a material includes illuminating the material with structured light and imaging remission by the material of the structured light. The method further includes determining, from captured remission images, sub-diffuse scattering parameters of the material. A structured-light imaging system for determining sub-diffuse scattering parameters of a material includes a structured-light illuminator, for illuminating the material with structured light of periodic spatial structure, and a camera for capturing images of the remission of the structured light by the material. The structured-light imaging system further includes an analysis module for processing the images to quantitatively determine the sub-diffuse scattering parameters. A software product includes machine-readable instructions for analyzing images of remission of structured light by a material to determine sub-diffuse scattering parameters of the material.
