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LEVEL FOR CHECKING INCLINATION OF STRUCTURE
专利权人:
BANG, SO YOON
发明人:
JEONG, MIN SI
申请号:
EP20150877377
公开号:
EP3093615(A1)
申请日:
2015.10.23
申请国别(地区):
欧洲专利局
年份:
2016
代理人:
摘要:
Disclosed herein is a level instrument for measuring an inclination of a structure, which may include a level instrument body; multiple transparent tubes which are installed at the level instrument body and are filled with bubbles and liquid; a nonconductive plate which is installed at the level instrument body and is equipped with one to four pairs of electrodes which are disposed at an inner circumferential surface of an inner space formed passing through the nonconductive plate; a conductive disk which is able to electrically connect any pair of one to four pairs of the electrodes based on a rolling position on an inner circumferential surface of the inner space; and multiple laser light oscillators which are installed at the level instrument body so as to emit a laser light when any pair of one to four pairs of the electrodes are electrically connected.
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