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Inclinometer
专利权人:
发明人:
申请号:
EP10192434.8
公开号:
EP2325602A3
申请日:
2010.11.24
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
An inclinometer configured to be coupled to a structure and measure an angle of inclination of the structure with respect to a reference plane comprises a first layer, a second layer, and an indicator. The first layer includes a transparent portion and a scale representing angles located proximate to the transparent portion. The second layer includes an opening that defines a path. The first layer is coupled to a first side of the second layer such that the transparent portion extends along the path. The indicator is movably disposed in the path. The indicator moves along the path as the structure moves between a first orientation and a second orientation with respect to the reference plane. The indicator cooperates with the scale to indicate an angle of inclination of the structure with respect to the reference plane.
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