PROBLEM TO BE SOLVED: To provide a method to optimize AO control of AO-SLO and AO-OCT mounted devices without complicating a device configuration.SOLUTION: An imaging device includes: a common optical system for irradiating the ocular fundus with a first measurement light from a first light source and a second measurement light from a second light source whose wavelengths are different from each other； first generation means for generating a tomographic image of the ocular fundus on the basis of an interference light obtained by causing a return light of the first measurement light from the ocular fundus through the common optical system and a corresponding reference light to interfere with each other； second generation means for generating an ocular fundus image of the ocular fundus on the basis of a return light of the second measurement light from the ocular fundus through the common optical system； wavefront detection means disposed in the common optical system for detecting a wavefront aberration of at least one of the lights of the wavefront aberration of the return light of the first measurement light and the wavefront aberration of the return light of the second measurement light； and selection means for selecting at least one of the lights of the return light of the first measurement light and the return light of the second measurement light. The wavefront detection means measures the wavefront aberration of the selected light.SELECTED DRAWING: Figure 1COPYRIGHT: (C)2020,JPO&INPIT【課題】 装置構成が複雑化することなくＡＯ－ＳＬＯ、ＡＯ－ＯＣＴ搭載装置のＡＯ制御を最適化する方法を提供することにある。【解決手段】 波長が互いに異なる第１の光源からの第１の測定光と第２の光源からの第２の測定光を眼底に照射するための共通光学系と、共通光学系を介した眼底からの第１の測定光の戻り光と、対応する参照光とを干渉させることによる干渉光に基づき、眼底の断層画像を生成する第１の生成手段と、共通光学系を介した眼底からの第２の測定光の戻り光に基づき、眼底の眼底画像を生成する第２の生成手段と、共通光学系に配置され、第１の測定光の戻り光の波面収差と第２の測定光の戻り光の波面収差の少なくとも一方の光の波面収差を検知する波面検知手段と、第１の測定光の戻り光と第２の測定光の戻り光の少なくとも一方の光を選択する選択手段とを有し、波面検知手段は選択された光の波面収差を測定する。【選択図】 図１
