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SURFACE SHAPE MEASURING DEVICE, AND SURFACE SHAPE MEASURING METHOD
专利权人:
TOKYO SEIMITSU CO., LTD.
发明人:
ISHIKAWA, Yasunari
申请号:
EP20080764773
公开号:
EP2037211(B1)
申请日:
2008.05.21
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要:
In a surface shape measurement device that measures the surface shape of a sample (W1, W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1, W2) and thereby detecting the amount of displacement of the probe (16, 26) caused by irregularities on the surface, an initial amount of displacement is detected which is the amount of displacement of the probe (16, 26) when the probe is first placed in contact with a measurement start point on the surface of the sample (W1, W2), and the amount of displacement of the probe (16, 26), detected as it is moved in a sliding fashion along the surface, is compared with the initial amount of displacement to determine whether the probe (16, 26) has reached a measurement end point.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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