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MANUFACTURING METHOD FOR ELECTRON MICROSCOPE SAMPLE AND MANUFACTURING APPARATUS FOR ELECTRON MICROSCOPE SAMPLE
专利权人:
FUJITSU LTD
发明人:
申请号:
JP20110052217
公开号:
JP2012189400(A)
申请日:
2011.03.09
申请国别(地区):
日本
年份:
2012
代理人:
摘要:
PROBLEM TO BE SOLVED: To enable an electron microscope sample to be thinned. SOLUTION: A manufacturing method for an electron microscope sample includes the steps of: mounting a sample in one end 34 of a tapered support table in which the one end 34 has thinner film thickness than another end, in such a manner that the front of the sample is visible when the other end side is watched from the one end side; irradiating the sample with convergent ion beams; and ion-trimming the upper faces by irradiating upper faces 44a and 44b which are faces of the sample in a film thickness direction of the support table, with ion beams 82 from the back of the sample. COPYRIGHT: (C)2013,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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