STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD

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专利权人:

KABUSHIKI KAISHA TOSHIBA

发明人:

IIDA Sanae,USUI Takashi

申请号：

US201715455976

公开号：

US2018074019(A1)

申请日:

2017.03.10

申请国别(地区):

美国

年份:

2018

代理人:

摘要：

According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.

来源网站：

中国工程科技知识中心

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http://www.ckcest.cn/home/