The present invention relates to an electron gun for facilitating position adjustment, and an electron microscope including the same, the electron gun improving a vacuum structure so as to easily move a filament block or an electron tip of an electron gun without having bellows for maintaining a vacuum when the center axis of the filament block or the electron tip of the electron gun is mechanically misaligned with the center axis of a anode and a focusing lens. Additionally, the electron gun enables an upper flat plate to be moved on a dual O-ring sealing unit or a magnetic fluid sealing unit without having bellows, which enclose and seal an electron beam generation unit, in order to align the center axis of an electron beam with a anode plate facing a Wehnelt cylinder or with a second anode arranged side by side to a field emission electron source and a first anode, such that an electron beam is easily aligned, a simplified structure and an easy assembling and disassembling are enabled, and a reusable rubbe
