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Evaluation aid
专利权人:
National University Corporation, Tohoku University;Mitaya Manufacturing Co., Ltd.
发明人:
Koichi Chida,Yuji Kaga,Goro Yokouchi
申请号:
US14610762
公开号:
US09332957B2
申请日:
2015.01.30
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An evaluation aid which can be used as a phantom (imitation lesion) when a digital X-ray image is taken and then evaluation is carried out through the digital X-ray image. The evaluation aid can be used to easily evaluate image qualities of a digital X-ray image for object parts having different X-ray absorption ratios at once. The evaluation aid is adapted to be used for taking a digital X-ray image thereof through which evaluation is carried out, and contains a substrate (plate-like body) including a plurality of regions having different X-ray absorption ratios; and step members provided on the plate-like body so as to correspond to the plurality of regions, respectively. Each step member includes a plurality of subregions having different X-ray absorption ratios. Thicknesses and/or constituent materials of the plurality of regions of the substrate may be different from each other to establish regions having different X-ray absorption ratios.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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