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Evaluation aid
专利权人:
National University Corporation, Tohoku University;Mitaya Manufacturing Co., Ltd.
发明人:
Koichi Chida,Yuji Kaga,Goro Yokouchi
申请号:
US15092376
公开号:
US09662087B2
申请日:
2016.04.06
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An evaluation aid serves as a phantom (imitation lesion) when a digital X-ray image is taken, and evaluation is then carried out through the digital X-ray image. The evaluation aid can simplify evaluating image qualities of a digital X-ray image for X-ray absorption parts having different X-ray absorption ratios all at once. The evaluation aid contains a substrate (plate-like body) including a plurality of regions having different X-ray absorption ratios for taking a digital X-ray image to carry out evaluation. Step members are provided on the plate-like body so as to correspond to the plurality of regions, respectively, where each step member includes a plurality of subregions having different X-ray absorption ratios. Preferably the thicknesses and/or constituent materials of the plurality of regions of the substrate are different from each other in order to have different X-ray absorption ratios in these regions.
来源网站:
中国工程科技知识中心
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