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IC output circuit with test data and shadow data inputs
专利权人:
Texas Instruments Incorporated
发明人:
Whetsel Lee D.
申请号:
US201514853315
公开号:
US9696378(B2)
申请日:
2015.09.14
申请国别(地区):
美国
年份:
2017
代理人:
Bassuk Lawrence J.`Brill Charles A.`Cimino Frank D.
摘要:
The disclosure describes a novel method and apparatus for providing a shadow access port within a device. The shadow access port is accessed to perform operations in the device by reusing the TDI, TMS, TCK and TDO signals that are used to operate a test access port within the device. The presence and operation of the shadow access port is transparent to the presence and operation of the test access port. According to the disclosure, the shadow access port operates on the falling edge of the TCK signal while the test access port conventionally operates on the rising edge of the TCK signal.
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