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Inductively coupled plasma mass spectrometry device
专利权人:
SEIKO INSTRUMENTS INC.
发明人:
ITO, TETSUMASA,NAKAGAWA, YOSHITOMO
申请号:
US19930045422
公开号:
US5334834(A)
申请日:
1993.04.13
申请国别(地区):
美国
年份:
1994
代理人:
摘要:
A structure for enabling control of the plasma potential of an ICP-MS. The structure includes: a shield plate 10 made of metal inserted between a plasma torch 1 and a high-frequency coil 2, a variable capacitor 11 connected between the shield plate 10 and ground, and an insulation member 15 is arranged to prevent contact of the high-frequency coil 2 with the shield plate 10. Even if a sample is introduced into ICP by any known method, it becomes capable to perform ICP-MS analysis while optimizing the response to interfering ions and detection sensitivity.
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