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DEBUGGING SCAN LATCH CIRCUITS USING FLIP DEVICES
专利权人:
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人:
WARNOCK James D.
申请号:
US201715416203
公开号:
US2017131353(A1)
申请日:
2017.01.26
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
A latch circuit having a master latch and a slave latch includes a device used to short either the master latch or the slave latch. The device includes a transistor and a global control used to assert a signal, and is positioned to short an inverter of the master latch or the slave latch. When the signal is asserted by the global control, the inverter is shorted such that the output value of the inverter is the same as the input value. The assertion of the signal is facilitated by another device connected to the master latch and the slave latch that includes the global control and a transistor.
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中国工程科技知识中心
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