System and Method to Mitigate X-Ray Image Parallax by Tilting the Sample

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专利权人:

Creative Electron; Inc.

发明人:

Guilherme Cardoso,Griffin LEMASTER

申请号：

US16703774

公开号：

US20200305824A1

申请日:

2019.12.04

申请国别(地区):

US

年份:

2020

代理人:

摘要：

A method for mitigating parallax for component reels being x-ray inspected, containing an x-ray inspection system and a plurality of reels circularly arranged in a conical field of view of an x-ray source of the x-ray inspection system, wherein a reels' inner edge is disposed higher than a reels' outer edge, wherein a plane of a reel is substantially parallel to a ray distances from the x-ray source.

来源网站：

中国工程科技知识中心

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http://www.ckcest.cn/home/