HIGHLY REFLECTIVE SURFACE PROFILE MEASUREMENT SYSTEM WITH AIR CONDENSATION AND METHOD THEREOF

• 收藏
• 分享

专利权人:

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

发明人:

HUNG Kuo-Feng,CHEN Chien-Chih

申请号：

US201514872876

公开号：

US2017052023(A1)

申请日:

2015.10.01

申请国别(地区):

美国

年份:

2017

代理人:

摘要：

The present disclosure provides a system and a method thereof for measuring highly reflective surface profile with air condensation. The method, suitable for measuring an article's shiny surface, includes the following steps: reducing the temperature of the air surrounding the article; performing an optical scanning toward the article's surface as to get a photoelectric signal; and processing the signal.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/