您的位置: 首页 > 农业专利 > 详情页

Semiconductor device having first and second oxide semiconductors with difference energy level
专利权人:
Semiconductor Energy Laboratory Co., Ltd.
发明人:
Tokunaga Hajime,Handa Takuya
申请号:
US201715432142
公开号:
US9761738(B2)
申请日:
2017.02.14
申请国别(地区):
美国
年份:
2017
代理人:
Robinson Intellectual Property Law Office `Robinson Eric J.
摘要:
To provide a semiconductor device which has transistor characteristics with little variation and includes an oxide semiconductor. The semiconductor device includes an insulating film over a conductive film and an oxide semiconductor film over the insulating film. The oxide semiconductor film includes a first oxide semiconductor layer, a second oxide semiconductor layer over the first oxide semiconductor layer, and a third oxide semiconductor layer over the second oxide semiconductor layer. The energy level of a bottom of a conduction band of the second oxide semiconductor layer is lower than those of the first and third oxide semiconductor layers. An end portion of the second oxide semiconductor layer is positioned on an inner side than an end portion of the first oxide semiconductor layer.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充