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CATHODE LUMINESCENCE MEASURING DEVICE AND ELECTRON MICROSCOPE
专利权人:
HORIBA LTD
发明人:
AWATA SHOGO
申请号:
JP20070249887
公开号:
JP2008107335(A)
申请日:
2007.09.26
申请国别(地区):
日本
年份:
2008
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a cathode luminescence measuring device capable of implementing high-resolution observation with an electron microscopy and high-resolution observation of cathode luminescence despite of simple configuration. SOLUTION: The device 1 for measuring a cathode luminescence CL generated by irradiating an electron ray EB to a sample W includes an electromagnetic objective lens 75 for converging the electron ray EB to be irradiated to the sample W and a condensing mirror section 411 for condensing cathode luminescence CL generated from the sample W to which the electron ray EB is irradiated, and is characterized by preparing the condensing mirror section 411 above the terminal at the sample W side of the electromagnetic objective lens 75 to apply a stray magnetic field from the electromagnetic objective lens 75 to the sample W. COPYRIGHT: (C)2008,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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