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SURFACE MEASURING DEVICE AND METHOD THEREOF
专利权人:
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人:
CHO Chia-Hung,CHUANG Kai-Ping,TSAI Ming-Cheng
申请号:
US201514934607
公开号:
US2017059310(A1)
申请日:
2015.11.06
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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