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Scan chain circuit and integrated circuit including the same
专利权人:
SAMSUNG ELECTRONICS CO., LTD.
发明人:
Park In-Gyu,Seo Dong-Wook,Lee Chan-Ho
申请号:
US201514706224
公开号:
US9897655(B2)
申请日:
2015.05.07
申请国别(地区):
美国
年份:
2018
代理人:
Sughrue Mion, PLLC
摘要:
A scan chain circuit includes first through N-th flip-flops connected in series to sequentially transfer data in response to a control signal, where N is an integer greater than 1. In the first through N-th flip-flops, the data are transferred in a first direction from the first flip-flop to the N-th flip-flop. The control signal is applied to the first through N-th flip-flops in a second direction opposite to the first direction from the N-th flip-flop to the first flip-flop.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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