Machine vision inspection devices and machine vision methods of inspection

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专利权人:

Mettler-Toledo, LLC

发明人:

White Timothy P.

申请号：

US201615197457

公开号：

US9485394(B1)

申请日:

2016.06.29

申请国别(地区):

美国

年份:

2016

代理人:

Standley Law Group LLP

摘要：

Machine vision inspection devices and machine vision methods for inspecting objects, such as objects with shiny surfaces. Device embodiments include an illumination housing with a central aperture and a specialized aperture cover. Use of the claimed device embodiments to inspect objects eliminates the void (dark spot) common to known machine vision inspection methods.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/