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Fragment ion mass spectra measured with tandem time-of-flight mass spectrometers
专利权人:
Bruker Daltonik GmbH
发明人:
Köster Claus
申请号:
US201615014091
公开号:
US9761430(B2)
申请日:
2016.02.03
申请国别(地区):
美国
年份:
2017
代理人:
Benoit & Côté Inc.
摘要:
The present invention provides a method for acquiring fragment ion mass spectra with a time-of-flight mass spectrometer, whereby mixed mass spectra with fragment ions of different parent ion species are acquired and compared with each other in such a way that the signals of those fragment ions which originate from the same parent ion species are determined. The time-of-flight mass spectrometer contains an ion source, a flight path, a reflector and an ion detector. The flight path is preferably field-free and is positioned before the reflector, and the reflector preferably has a quadratically increasing reflection potential.
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