Liveness testing methods and apparatuses and image processing methods and apparatuses

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专利权人:

SAMSUNG ELECTRONICS CO., LTD.

发明人:

Kim Wonjun,Suh Sungjoo,Han Jaejoon,Hwang Wonjun

申请号：

US201514612632

公开号：

US9679212(B2)

申请日:

2015.02.03

申请国别(地区):

美国

年份:

2017

代理人:

Harness, Dickey & Pierce

摘要：

A liveness testing apparatus includes a testing circuit. The testing circuit is configured to test a liveness of an object included in a received input image based on whether an image of the object has a characteristic indicative of a flat surface or a characteristic indicative of a three-dimensional (3D) structure.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/