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DIFFRACTION GRATING FOR X-RAY PHASE CONTRAST AND/OR DARK-FIELD IMAGING
专利权人:
Koninklijke Philips N.V.
发明人:
KOEHLER, Thomas
申请号:
EP20170189540
公开号:
EP3454051(A1)
申请日:
2017.09.06
申请国别(地区):
欧洲专利局
年份:
2019
代理人:
摘要:
The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure. The photo-resist layer is etched to remove parts of the photo-resist layer, to leave a plurality of trenches that are laterally spaced from one across the surface of the substrate. A plurality of material layers are formed on the surface of the substrate. Each layer is formed in a trench. A material layer comprises a plurality of materials, wherein the plurality of materials are formed one on top of the other in a direction perpendicular to the surface of the substrate. The plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and the plurality of materials comprises Gold.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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