PROBLEM TO BE SOLVED: To provide technology with which it is possible to mono-dimensionally scan a test object using a two-dimensional interferometer and easily and efficiently acquire the data needed for two-dimensional phase restoration.SOLUTION: Provided is a two-dimensional interference pattern imaging device equipped with a two-dimensional interferometer for forming an interference pattern having two cyclic directions due to an electromagnetic wave having permeated a test object, a detector for imaging the interference pattern, and movement means for moving the test object and/or the two-dimensional interferometer, wherein the relative positions of the test object and the two-dimensional interferometer are changed in a mono-dimensional scan direction different from any of the two cyclic directions by the movement means, and while so doing, images are captured N times by the detector (N is an integer greater than or equal to 2), thereby acquiring N items of image data used in the phase restoration of the test object.SELECTED DRAWING: Figure 3【課題】二次元干渉計を用いて被検体を一次元に走査して二次元の位相回復に必要なデータを簡易かつ効率的に取得する技術を提供する。【解決手段】被検体を透過した電磁波により二つの周期方向をもつ干渉パターンを形成する二次元干渉計と、前記干渉パターンを撮像する検出器と、前記被検体と前記二次元干渉計のうちの少なくとも一方を移動させる移動手段と、を備える二次元干渉パターン撮像装置において、前記移動手段によって前記被検体と前記二次元干渉計の相対位置を前記二つの周期方向のいずれとも異なる一次元の走査方向に変化させながら、前記検出器によってＮ回（Ｎは２以上の整数）の撮像を行うことによって、前記被検体の位相回復処理に用いられるＮ枚の画像のデータを取得する。【選択図】図３
