MASSACHUSETTS INSTITUTE OF TECHNOLOGY;BARRY, John F.;BRAJE, Danielle A.;EISENACH, Erik R.;MCNALLY, Christopher Michael;O'KEEFFE, Michael F.;PHAM, Linh M.
发明人:
BARRY, John F.,BRAJE, Danielle A.,EISENACH, Erik R.,MCNALLY, Christopher Michael,O'KEEFFE, Michael F.,PHAM, Linh M.
申请号：
WO2018US63044
公开号：
WO2019108781(A1)
申请日:
2018.11.29
申请国别(地区):
世界知识产权组织国际局
年份:
2019
代理人:
摘要：
Here we present a solid-state spin sensor with enhanced sensitivity. The enhanced sensitivity is achieved by increasing the T 2 * dephasing time of the color center defects within the solid-state spin sensor. The T 2 * dephasing time extension is achieved by mitigating dipolar coupling between paramagnetic defects within the solid-state spin sensor. The mitigation of the dipolar coupling is achieved by applying a magic-angle-spinning magnetic field to the color center defects. This field is generated by driving a magnetic field generator (e.g., Helmholtz coils) with phase-shifted sinusoidal waveforms from current source impedance-matched to the magnetic field generator. The waveforms may oscillate (and the field may rotate) at a frequency based on the precession period of the color center defects to reduce color center defect dephasing and further enhance measurement sensitivity.
