PROBLEM TO BE SOLVED: To provide an X-ray imaging apparatus that can acquire phase information in two directions perpendicular to each other and photograph an X-ray phase contrast image with high accuracy with a simple configuration.SOLUTION: The X-ray imaging apparatus includes: a source grate that is disposed between an X-ray source and an object to be examined and has a one-dimensional periodic structure a phase diffraction grating that has a second-dimensional periodic structure forming a self-image by X-ray Talbot effect an absorption grating that is disposed in a position where the self-image is formed by the phase diffraction grating an X-ray detector configured to detect an intensity of the X-ray that penetrates the absorption grating and a calculation unit that acquires the phase information by the intensity of the X-ray detected by the X-ray detector. The X-ray intensity detected by the X-ray detector is calculated by the calculation unit to acquire the phase information before and after the source grating is rotated by 90° in a plane parallel to the phase grating.COPYRIGHT: (C)2013,JPO&INPIT【課題】簡単な構成で互いに直交する2方向の位相情報を取得することができ、精度の高いX線位相コントラスト像の撮像が可能となるX線撮像装置を提供する。【解決手段】X線撮像装置であって、X線源と被検査物との間に配置され、1次元周期構造を有する線源格子と、X線のトールボット効果により自己像を形成する2次元周期構造を有する位相回折格子と、位相回折格子によって自己像が形成される位置に配置される吸収格子と、吸収格子を透過したX線の強度を検出可能に構成されたX線検出器と、X線検出器により検出されたX線の強度により、位相情報を取得する演算手段と、を備え、線源格子を位相格子と平行な面内で90度回転させる前後においてX線検出器で検出されたX線強度を、演算手段によって演算して位相情報を取得する。【選択図】 図1
