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Flaw detection method and flaw detection apparatus
专利权人:
CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY
发明人:
HIGUCHI SADAO
申请号:
US20050315145
公开号:
US2006152216(A1)
申请日:
2005.12.23
申请国别(地区):
美国
年份:
2006
代理人:
摘要:
A flaw detection apparatus comprises: a coil for producing an alternating-current magnetic field for flowing eddy currents in a magnetic material as a member to be flaw-detected; a magneto-optical element disposed at the center of an inner peripheral portion of the coil and having a reflective film at an end face thereof opposed to the face of the member to be flaw-detected; an optical fiber for entering light from a light source into the magneto-optical element toward the reflective film via a circulator; an optical fiber for entering reflected light reflected by the reflective film into an analyzer via the circulator; a photoelectric conversion element for converting output light of the analyzer into an electrical signal; and a computing device for processing an output signal of the photoelectric conversion element and detecting a flaw of the member to be flaw-detected, based on the rotation angle of the plane of polarization of the reflected light.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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