您的位置: 首页 > 农业专利 > 详情页

SYSTEM AND METHOD FOR ANALYZING QUALITY CRITERIA OF A RADIATION SPOT
专利权人:
Elbit Systems Electro-optics Elop Ltd.
发明人:
PE'ER, Idit
申请号:
EP20150822362
公开号:
EP3170024(A1)
申请日:
2015.07.19
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要:
A system and method for analyzing quality criteria of a radiation spot are provided herein. The system may include: at least one controllable electromagnetic radiation source configured to generate and transmit a radiation beam onto an object, resulting in a radiation spot on said object; at least one radiation sensor configured to sense and obtain radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other; and an analyzer configured to analyze said radiation reflections, and determine a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria. The method may implement the aforementioned logic in a different architecture.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充