FIELD: molecular structure examination methods. ^ SUBSTANCE: distinguishing feature of invention resides in (i) possibility of displacement of probing particles source and/or support or needle to predetermined distance with linear quantization step up to 0.01 nm and angular quantization step up to 10-3 angular seconds with the aid of precision positioning device possessing required number of freedom degrees and allowing angular and linear displacements to be performed to an extent, which at least corresponds to size of investigated molecule, and (ii) fixation, in each position, of distribution of elastically scattered probing particles according to their intensities and angles with the help of hemispheric matrix analyzer. Restoration of scattering sites, which are atoms of the molecule being investigated, is possible by computation from spatial scattering indicatrix of probing particles or from interference pattern arising as a result of interaction of primary probing particle beam with elastically scattered
