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Method for determining deviations between coordinate systems of various technical systems
专利权人:
Wavelight GmbH
发明人:
Abraham, Mario,Matschnigg, Joachim,Agethen, Johannes,Klafke, Mario
申请号:
AU2010345463
公开号:
AU2010345463A1
申请日:
2010.02.15
申请国别(地区):
AU
年份:
2012
代理人:
摘要:
The invention relates to a method for determining deviations between coordinate systems of various technical systems comprising the steps of determining a coordinate position of a reference feature (32) of a test object (26) in the coordinate system (u, v) of a first of the technical systems, applying at least one test feature (34) to the test object, wherein the test feature is applied in the coordinate system of a second of the technical systems at a coordinate position that is established according to the determined coordinate position of the reference feature (32), determining a coordinate position of the at least one test feature (34) and/or of at least one feature (36) derived therefrom in the coordinate system (u, v) of the first technical system, and determining deviations between the coordinate systems of the first and the second technical system at least on the basis of: a) the determined coordinate position of the at least one test feature (34) and/or of the at least one feature (36) derived therefrom in the coordinate system (u, v) of the first technical system, and b) the coordinate position of the reference feature (32) in the coordinate system (u, v) of the first technical system.
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