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Method for determining deviations between coordinate systems of different technical systems
专利权人:
Mario Abraham
发明人:
Mario Abraham,Johannes Agethen,Mario Klafke,Joachim Matschnigg
申请号:
US13577385
公开号:
US09173560B2
申请日:
2010.02.15
申请国别(地区):
US
年份:
2015
代理人:
摘要:
Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical system and (b) the coordinate position of the reference feature in the coordinate system (u,v) of the first technical system.
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