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ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS APPARATUS HAVING DEVICE FOR MEASURING SPECIMEN CONTACT AREA AND METHOD OF OPERATING THE SAME
专利权人:
发明人:
Sangyun PARK,Sangkyu KIM
申请号:
US14809433
公开号:
US20160198985A1
申请日:
2015.07.27
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An attenuated total reflection (ATR) spectroscopic analysis apparatus includes an ATR prism including: an upper surface that contacts a specimen, a lower surface facing the upper surface, a first surface that is slanted and connected to the upper surface and the lower surface, and a second surface that is slanted and connected to the upper surface and the lower surface and facing the first surface a light source configured to emit a light towards the first surface of the ATR prism a light receiver that is provided to face the lower surface of the ATR prism and configured to receive the light that is diffusely reflected and output from the lower surface and output an electrical signal based on the received light and a computation processor configured to calculate a contact area of the specimen with the upper surface of the ATR prism in response to the electrical signal.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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