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スリットランプ顕微鏡
专利权人:
株式会社トプコン
发明人:
佐藤 俊明,武田 孝紀,渡辺 孝浩
申请号:
JP2017078829
公开号:
JP6431562B2
申请日:
2017.04.12
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a slit lamp microscope capable of controlling the irradiation state of slit light and the irradiation state of background illumination light to be linked to each other.SOLUTION: The slit lamp microscope comprises a main illumination system, a background illumination system, an observation system, a control part, and a storage part. The main illumination system includes a first light source part for outputting first light and a slit forming part for forming a width-variable slit, and illuminates a subjects eye with the first light having passed through the slit. The background illumination system includes a second light source part for outputting second light and illuminates a peripheral area of the illumination area of the first light to the subjects eye with the second light. The observation system guides reflection light of the first light and reflection light of the second light by the subjects eye to an ocular lens and an image pickup device. The storage part stores mapping information obtained by mapping the control contents of the slit forming part and the second light source part. The control part controls the slit forming part and the second light source part on the basis of the mapping information.SELECTED DRAWING: Figure 3COPYRIGHT: (C)2017,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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