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SLIT LAMP MICROSCOPE
专利权人:
KABUSHIKI KAISHA TOPCON
发明人:
Toshiaki SATO,Takanori TAKEDA,Takahiro WATANABE
申请号:
US15377691
公开号:
US20170086669A1
申请日:
2016.12.13
申请国别(地区):
US
年份:
2017
代理人:
摘要:
Provided is a slit lamp microscope capable of controlling irradiation of slit light and background illumination light interlockingly. Embodiment includes a main illumination system, background illumination system, observation system and controller. The main illumination system includes a first light source unit that outputs first light and slit forming unit that forms a slit with changeable width, and illuminates an eye with the first light having passed through the slit. The background illumination system includes a second light source unit that outputs second light, and illuminates a peripheral area of an eye area irradiated with the first light. The observation system includes an eyepiece lens, imaging device, and group of optical elements that guides reflected light of the first light and reflected light of the second light from the eye to the eyepiece lens and imaging device. The controller interlockingly controls the main illumination system and second light source unit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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