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Measuring apparatus
专利权人:
Takashi Nakagawa
发明人:
Takashi Nakagawa
申请号:
US13531123
公开号:
US09451907B2
申请日:
2012.06.22
申请国别(地区):
US
年份:
2016
代理人:
摘要:
In a measurement situation information storage unit, a plurality of sets of measurement situation information for identifying a measurement situation in which predetermined measurement is performed on a measurement target are stored in association with time periods. A measurement processing unit executes measurement on the measurement target. A display unit selects, from among the plurality of sets of measurement situation information, a set of measurement situation information corresponding to the measurement operation timing based on the time of the measurement operation timing or based on processing results obtained as a result of execution of measurement by the measurement processing unit, and causes a display to show the selected set of measurement situation information in a manner distinguishable from other measurement situation information.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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