Impedance calibration circuit, and semiconductor memory and memory system using the same

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专利权人:

SK HYNIX INC.

发明人:

Jeong Chun Seok

申请号：

US201414564404

公开号：

US9552894(B2)

申请日:

2014.12.09

申请国别(地区):

美国

年份:

2017

代理人:

William Park & Associates Ltd.

摘要：

An embodiment may include a first replica driver group configured for replicating an output driver of a physical area. A second replica driver group configured for replicating an output driver of a test electrode area for direct access of a memory, and an impedance calibration unit configured to independently perform an impedance matching operation of the first replica driver group and the second replica driver group.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/