您的位置: 首页 > 农业专利 > 详情页

光侵入深さ評価方法、その評価方法を用いた性能検査方法および光断層画像撮像装置
专利权人:
富士フイルム株式会社
发明人:
平山 平二郎,中村 崇市郎
申请号:
JP2016556212
公开号:
JP6378776B2
申请日:
2015.10.22
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
There are provided a light penetration depth evaluation method capable of evaluating the penetration depth of ultraviolet light for a measurement target in a non-destructive and non-invasive manner, a performance test method using the evaluation method, and an optical tomography apparatus using the evaluation method. Using an optical tomography method of splitting low coherent light (L 0 ) into sample light (L 1 ) and reference light (L 2 ), emitting the sample light (L 1 ) to a measurement target (S) in a line shape, generating interference light (L 4 ) by superimposing reflected light (L 3 ) from the measurement target (S) due to emission of the sample light (L 1 ) and the reference light (L 2 ) on each other, and acquiring a two-dimensional spectroscopic tomographic image of the measurement target (S) by spectroscopically detecting the interference light (L 4 ) and performing frequency analysis, an arbitrary wavelength region in an ultraviolet region is cut out from low coherent light including a wavelength region from an ultraviolet region to a visible region and the arbitrary wavelength region is shaped into a spectrum having an arbitrary wavelength width, the two-dimensional spectroscopic tomographic image is acquired as using the low coherent light (L 0 ), and the penetration depth of the sample light for the measurement target is evaluated based on the two-dimensional spectroscopic tomographic image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充