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LIGHT PENETRATION DEPTH EVALUATION METHOD, PERFORMANCE TEST METHOD USING EVALUATION METHOD, AND OPTICAL TOMOGRAPHY APPARATUS
专利权人:
FUJIFILM Corporation
发明人:
Heijiro HIRAYAMA,Sohichiro NAKAMURA
申请号:
US15496130
公开号:
US20170224219A1
申请日:
2017.04.25
申请国别(地区):
US
年份:
2017
代理人:
摘要:
Using an optical tomography method of splitting low coherent light into sample light and reference-light, emitting the sample light to a measurement-target in a line shape, generating interference light by superimposing reflected light from the measurement-target due to emission of the sample light and the reference-light on each other, and acquiring a two-dimensional spectroscopic tomographic-image of the measurement-target by spectroscopically detecting the interference light and performing frequency analysis, an arbitrary wavelength region in an ultraviolet region is cut out from low coherent light including a wavelength region from an ultraviolet region to a visible region and the arbitrary wavelength region is shaped into a spectrum having an arbitrary wavelength width, the two-dimensional spectroscopic tomographic-image is acquired as using the low coherent light, and the penetration depth of the sample light for the measurement-target is evaluated based on the two-dimensional spectroscopic tomographic-image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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