PROBLEM TO BE SOLVED: To provide an X-ray inspection system that has a solid state image pickup device capable of high speed operation.SOLUTION: The X-ray inspection system images X-rays output from an X-ray generation device and transmitted through an object of inspection by means of a solid state image pickup device 1A to inspect the object of inspection. The solid state image pickup device 1A includes a light reception section 10A and a signal readout section 20. The light reception section has M×N pixel sections arrayed in M rows and N columns. In a first imaging mode, voltage values depending on amounts of charges generated in photodiodes of the M×N pixel sections of the light reception section are output from the signal readout section. In a second imaging mode, voltage values depending on amounts of charges generated in the photodiodes of pixel sections included in a specific region of consecutive Mrows in the light reception section are output from the signal readout section. The direction of length of the specific region in the light reception section in the second imaging mode is perpendicular to the direction of movement of the solid state image pickup device.
