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Electron Impact Ion Source With Fast Response
专利权人:
LECO Corporation
发明人:
Verenchikov Anatoly N.
申请号:
US201314397274
公开号:
US2015144779(A1)
申请日:
2013.04.26
申请国别(地区):
美国
年份:
2015
代理人:
摘要:
A closed electron impact ion source with overall opening area of less than 30 mm2 is employed for direct and pulsed extraction into a time-flight mass spectrometer in order to enhance sensitivity and immunity to chemical noise of oil and fumes of the vacuum system. For compatibility with dual stage GC×GC separation, the source may contain an inert liner surrounded by an isothermal cage of thermally conductive material. The source inner surface may be reduced to under 100 mm2. A portion of carrier gas may be pumped down before admitting the sample and carrier gas into the source. A cooled surface may be used to condense fumes at the analysis time.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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