To realize an X-ray imaging apparatus having one shot, high spatial resolution, and capable of calculating a physical quantity such as a quantitative phase shift map.An interference image outputted from an interferometer is detected by irradiating X-rays to a sample and outputting phase shift and absorption of X-rays generated by X-rays passing through the sample as an interference image, and An X-ray image detector 8, a control device 9, and a processing unit 10 for calculating a physical quantity from the pixel values of the interference image detected by the X-ray image detector, and the control device 9 controls the X-In the state of withdrawing from the optical path, a plurality of first interference images are detected by making the phase shift amounts different from each other and a second interference image is detected in a state where the sample is set on the optical path of the X-ray, and the processing section 10 A relationship between the phase of the X-ray and the pixel value of the interference image is obtained from the first interference image of the first interference image, and based on the relationship between the obtained X-ray phase and the pixel value of the interference image and the pixel value of the second interference image, Calculate the physical quantity.(FIG.【課題】ワンショットで、高い空間分解能を有し、定量的な位相シフトマップなどの物理量を算出可能なX線撮像装置を実現する。【解決手段】X線を試料に照射し、X線が試料を透過することによって生じるX線の位相シフト及び吸収を干渉像として出力する干渉計2と、干渉計の出力する干渉像を検出するX線画像検出器8と、制御装置9と、X線画像検出器により検出された干渉像の画素値から物理量を算出する処理部10とを有し、制御装置9は、試料をX線の光路から退避した状態で位相シフト量をそれぞれ異ならせて複数の第1干渉像を検出し、試料をX線の光路上に設置した状態で第2干渉像を検出し、処理部10は、複数の第1干渉像からX線の位相と干渉像の画素値との関係を求め、求められたX線の位相と干渉像の画素値との関係と第2干渉像の画素値とに基づき、物理量を算出する。【選択図】図7
