您的位置: 首页 > 农业专利 > 详情页

Interferometer with continuously varying path length measured in wavelengths to the reference mirror
专利权人:
Nanowave, Inc.
发明人:
Ohara Tetsuo
申请号:
US201313856507
公开号:
US9464882(B2)
申请日:
2013.04.04
申请国别(地区):
美国
年份:
2016
代理人:
Chapin Intellectual Property Law, LLC
摘要:
An interferometer in which the path length of the reference beam, measured in wavelengths, is continuously changing in sinusoidal fashion and the interference signal created by combining the measurement beam and the reference beam is processed in real time to obtain the physical distance along the measurement beam between the measured surface and a spatial reference frame such as the beam splitter. The processing involves analyzing the Fourier series of the intensity signal at one or more optical detectors in real time and using the time-domain multi-frequency harmonic signals to extract the phase information independently at each pixel position of one or more optical detectors and converting the phase information to distance information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充