您的位置: 首页 > 农业专利 > 详情页

ELECTRON MICROSCOPE
专利权人:
发明人:
申请号:
JP20000212961
公开号:
JP2002025491(A)
申请日:
2000.07.13
申请国别(地区):
日本
年份:
2002
代理人:
摘要:
PROBLEM TO BE SOLVED: To automatically decide whether a field of view picked up is a field of view suitable for retrieval of the intended form to efficiency extract only the necessary field of view. SOLUTION: The state of a field of view is decided (S17), by a method of preparing a line profile of the field of view picked up to measure brightness (gradation), a method of determining the cross-correlation between two transmission images of the same field of view, taken with electron-optical conditions varied to find the degree of coincidence (correlation function) between them or a method of determining the phase-limited correlation between two transmission images taken with conditions varied to find the degree of coincidence between them, thereby transferring to the next field of view, when the field of view decided as being not suitable for observation/retrieval.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充