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栽培異常監視装置、栽培異常監視方法、及びプログラム
专利权人:
NECソリューションイノベータ株式会社
发明人:
島津 秀雄
申请号:
JP2014073547
公开号:
JP6376590B2
申请日:
2014.03.31
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a cultivation abnormality monitor, a cultivation abnormality monitoring method, and a program which support farming instruction by an instructor, and are capable of improving a problem of lack of instruction time due to insufficient number of instructors.SOLUTION: A cultivation abnormality monitor 10 is a device for monitoring abnormality that occurs when cultivating agricultural products. The cultivation abnormality monitor 10 comprises: an allowable value storage part 11 which stores a minimum value and a maximum value which are set for a specific attribute regarding an agricultural product an attribute value storage part 12 which stores an attribute value of a specific attribute input by a user and a monitoring part 13 which determines whether or not the attribute value is within a range defined by the minimum value and the maximum value, and, when the attribute value is not within the range, notifies the user that the value is not within the range.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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